M. Porti, X. Blasco, M. Nafría, X. Aymerich, Alexander Olbrich, Bernd Ebersberger. Local current fluctuations before and after breakdown of thin SiO::2:: films observed with conductive atomic force microscope. Microelectronics Reliability, 41(7):1041-1044, 2001. [doi]
@article{PortiBNAOE01,
title = {Local current fluctuations before and after breakdown of thin SiO::2:: films observed with conductive atomic force microscope},
author = {M. Porti and X. Blasco and M. Nafría and X. Aymerich and Alexander Olbrich and Bernd Ebersberger},
year = {2001},
doi = {10.1016/S0026-2714(01)00066-X},
url = {http://dx.doi.org/10.1016/S0026-2714(01)00066-X},
researchr = {https://researchr.org/publication/PortiBNAOE01},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {41},
number = {7},
pages = {1041-1044},
}