Exploring BDDs to reduce test pattern set

Gabriel S. Porto, Paulo F. Butzen, Denis Teixeira Franco. Exploring BDDs to reduce test pattern set. In 18th IEEE Latin American Test Symposium, LATS 2017, Bogotá, Colombia, March 13-15, 2017. pages 1-4, IEEE, 2017. [doi]

Abstract

Abstract is missing.