Linking Chip, Board, and System Test via Standards

Michele Portolan, Jeff Rearick, Martin Keim. Linking Chip, Board, and System Test via Standards. In IEEE European Test Symposium, ETS 2020, Tallinn, Estonia, May 25-29, 2020. pages 1-8, IEEE, 2020. [doi]

Authors

Michele Portolan

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Jeff Rearick

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Martin Keim

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