Michele Portolan, Jeff Rearick, Martin Keim. Linking Chip, Board, and System Test via Standards. In IEEE European Test Symposium, ETS 2020, Tallinn, Estonia, May 25-29, 2020. pages 1-8, IEEE, 2020. [doi]
@inproceedings{PortolanRK20,
title = {Linking Chip, Board, and System Test via Standards},
author = {Michele Portolan and Jeff Rearick and Martin Keim},
year = {2020},
doi = {10.1109/ETS48528.2020.9131595},
url = {https://doi.org/10.1109/ETS48528.2020.9131595},
researchr = {https://researchr.org/publication/PortolanRK20},
cites = {0},
citedby = {0},
pages = {1-8},
booktitle = {IEEE European Test Symposium, ETS 2020, Tallinn, Estonia, May 25-29, 2020},
publisher = {IEEE},
isbn = {978-1-7281-4312-5},
}