R. R. Potera, T. Witt, Y. Zheng. Analysis of Transient HTRB Leakage in a SiC Field Ring Termination. In 2020 IEEE International Reliability Physics Symposium, IRPS 2020, Dallas, TX, USA, April 28 - May 30, 2020. pages 1-5, IEEE, 2020. [doi]
Abstract is missing.