Seetal Potluri, Satya Trinadh Adireddy, Chidhambaranathan Rajamanikkam, Shankar Balachandran. LPScan: An algorithm for supply scaling and switching activity minimization during test. In 2013 IEEE 31st International Conference on Computer Design, ICCD 2013, Asheville, NC, USA, October 6-9, 2013. pages 463-466, IEEE, 2013. [doi]
Abstract is missing.