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Structural pattern extraction from asynchronous two-photon laser fault injection using spectral analysis

Vincent Pouget, S. Jonathas, R. Job, J.-R. Vaillé, Frederic Wrobel, Frédéric Saigné. Structural pattern extraction from asynchronous two-photon laser fault injection using spectral analysis. Microelectronics Reliability, 76:650-654, 2017. [doi]

Authors

Vincent Pouget

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S. Jonathas

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R. Job

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J.-R. Vaillé

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Frederic Wrobel

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Frédéric Saigné

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