Vincent Pouget, S. Jonathas, R. Job, J.-R. Vaillé, Frederic Wrobel, Frédéric Saigné. Structural pattern extraction from asynchronous two-photon laser fault injection using spectral analysis. Microelectronics Reliability, 76:650-654, 2017. [doi]
@article{PougetJJVWS17,
title = {Structural pattern extraction from asynchronous two-photon laser fault injection using spectral analysis},
author = {Vincent Pouget and S. Jonathas and R. Job and J.-R. Vaillé and Frederic Wrobel and Frédéric Saigné},
year = {2017},
doi = {10.1016/j.microrel.2017.07.028},
url = {https://doi.org/10.1016/j.microrel.2017.07.028},
researchr = {https://researchr.org/publication/PougetJJVWS17},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {76},
pages = {650-654},
}