An enhanced approach to reduce test application time through limited shift operations in scan chains - researchr publication authors

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Konstantinos Poulos, Jayasurya Kuchi, Themistoklis Haniotakis. An enhanced approach to reduce test application time through limited shift operations in scan chains. In 2017 IEEE North Atlantic Test Workshop, NATW 2017, Providence, RI, USA, May 8-10, 2017. pages 1-4, IEEE, 2017. [doi]

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