Konstantinos Poulos, Jayasurya Kuchi, Themistoklis Haniotakis. An enhanced approach to reduce test application time through limited shift operations in scan chains. In 2017 IEEE North Atlantic Test Workshop, NATW 2017, Providence, RI, USA, May 8-10, 2017. pages 1-4, IEEE, 2017. [doi]
@inproceedings{PoulosKH17,
title = {An enhanced approach to reduce test application time through limited shift operations in scan chains},
author = {Konstantinos Poulos and Jayasurya Kuchi and Themistoklis Haniotakis},
year = {2017},
doi = {10.1109/NATW.2017.7938026},
url = {https://doi.org/10.1109/NATW.2017.7938026},
researchr = {https://researchr.org/publication/PoulosKH17},
cites = {0},
citedby = {0},
pages = {1-4},
booktitle = {2017 IEEE North Atlantic Test Workshop, NATW 2017, Providence, RI, USA, May 8-10, 2017},
publisher = {IEEE},
isbn = {978-1-5090-5902-7},
}