Peyman Pouyan, Esteve Amat, Antonio Rubio. Process variability-aware proactive reconfiguration technique for mitigating aging effects in nano scale SRAM lifetime. In 30th IEEE VLSI Test Symposium, VTS 2012, Maui, Hawaii, USA, 23-26 April 2012. pages 240-245, IEEE, 2012. [doi]
@inproceedings{PouyanAR12,
title = {Process variability-aware proactive reconfiguration technique for mitigating aging effects in nano scale SRAM lifetime},
author = {Peyman Pouyan and Esteve Amat and Antonio Rubio},
year = {2012},
doi = {10.1109/VTS.2012.6231060},
url = {http://dx.doi.org/10.1109/VTS.2012.6231060},
researchr = {https://researchr.org/publication/PouyanAR12},
cites = {0},
citedby = {0},
pages = {240-245},
booktitle = {30th IEEE VLSI Test Symposium, VTS 2012, Maui, Hawaii, USA, 23-26 April 2012},
publisher = {IEEE},
isbn = {978-1-4673-1074-1},
}