Theo J. Powell, Kenneth M. Butler, Mike Ales, Roy Haley, Mark Perry. Correlating defect level to final test fault coverage for modular structured designs [microcontroller family]. In 12th IEEE VLSI Test Symposium (VTS'94), April 25-28, 1994, Cherry Hill, New Jersey, USA. pages 192-196, IEEE Computer Society, 1994. [doi]
Abstract is missing.