Theo J. Powell, Amrendra Kumar, Joseph Rayhawk, Nilanjan Mukherjee. Chasing subtle embedded RAM defects for nanometer technologies. In Proceedings 2005 IEEE International Test Conference, ITC 2005, Austin, TX, USA, November 8-10, 2005. pages 9, IEEE, 2005. [doi]
@inproceedings{PowellKRM05, title = {Chasing subtle embedded RAM defects for nanometer technologies}, author = {Theo J. Powell and Amrendra Kumar and Joseph Rayhawk and Nilanjan Mukherjee}, year = {2005}, doi = {10.1109/TEST.2005.1584048}, url = {http://doi.ieeecomputersociety.org/10.1109/TEST.2005.1584048}, researchr = {https://researchr.org/publication/PowellKRM05}, cites = {0}, citedby = {0}, pages = {9}, booktitle = {Proceedings 2005 IEEE International Test Conference, ITC 2005, Austin, TX, USA, November 8-10, 2005}, publisher = {IEEE}, isbn = {0-7803-9038-5}, }