Delta Iddq for Testing Reliability

Theo J. Powell, James R. Pair, Melissa St. John, Doug Counce. Delta Iddq for Testing Reliability. In 18th IEEE VLSI Test Symposium (VTS 2000), 30 April - 4 May 2000, Montreal, Canada. pages 439-443, IEEE Computer Society, 2000. [doi]

Authors

Theo J. Powell

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James R. Pair

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Melissa St. John

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Doug Counce

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