Theo J. Powell, James R. Pair, Melissa St. John, Doug Counce. Delta Iddq for Testing Reliability. In 18th IEEE VLSI Test Symposium (VTS 2000), 30 April - 4 May 2000, Montreal, Canada. pages 439-443, IEEE Computer Society, 2000. [doi]
@inproceedings{PowellPJC00,
title = {Delta Iddq for Testing Reliability},
author = {Theo J. Powell and James R. Pair and Melissa St. John and Doug Counce},
year = {2000},
url = {http://csdl.computer.org/comp/proceedings/vts/2000/0613/00/06130439abs.htm},
tags = {testing, reliability},
researchr = {https://researchr.org/publication/PowellPJC00},
cites = {0},
citedby = {0},
pages = {439-443},
booktitle = {18th IEEE VLSI Test Symposium (VTS 2000), 30 April - 4 May 2000, Montreal, Canada},
publisher = {IEEE Computer Society},
isbn = {0-7695-0613-5},
}