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Functional test generation for hard to detect stuck-at faults using RTL model checking

Mahesh Prabhu, Jacob A. Abraham. Functional test generation for hard to detect stuck-at faults using RTL model checking. In 17th IEEE European Test Symposium, ETS 2012, May 28th - June 1st 2012, Annecy, France. pages 1-6, IEEE Computer Society, 2012. [doi]

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