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Frequency scaled segmented (FSS) scan architecture for optimized scan-shift power and faster test application time

W. Pradeep, P. Narayanan, R. Mittal, N. Maheshwari, N. Naresh. Frequency scaled segmented (FSS) scan architecture for optimized scan-shift power and faster test application time. In IEEE International Test Conference, ITC 2017, Fort Worth, TX, USA, October 31 - Nov. 2, 2017. pages 1-10, IEEE, 2017. [doi]

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W. Pradeep

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P. Narayanan

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R. Mittal

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N. Maheshwari

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N. Naresh

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