W. Pradeep, P. Narayanan, R. Mittal, N. Maheshwari, N. Naresh. Frequency scaled segmented (FSS) scan architecture for optimized scan-shift power and faster test application time. In IEEE International Test Conference, ITC 2017, Fort Worth, TX, USA, October 31 - Nov. 2, 2017. pages 1-10, IEEE, 2017. [doi]
@inproceedings{PradeepNMMN17,
title = {Frequency scaled segmented (FSS) scan architecture for optimized scan-shift power and faster test application time},
author = {W. Pradeep and P. Narayanan and R. Mittal and N. Maheshwari and N. Naresh},
year = {2017},
doi = {10.1109/TEST.2017.8242052},
url = {https://doi.org/10.1109/TEST.2017.8242052},
researchr = {https://researchr.org/publication/PradeepNMMN17},
cites = {0},
citedby = {0},
pages = {1-10},
booktitle = {IEEE International Test Conference, ITC 2017, Fort Worth, TX, USA, October 31 - Nov. 2, 2017},
publisher = {IEEE},
isbn = {978-1-5386-3413-4},
}