Predicting X-Sensitivity of Circuit-Inputs on Test-Coverage: A Machine-Learning Approach - researchr publication

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Manjari Pradhan, Bhaswar B. Bhattacharya, Krishnendu Chakrabarty, Bhargab B. Bhattacharya. Predicting X-Sensitivity of Circuit-Inputs on Test-Coverage: A Machine-Learning Approach. IEEE Trans. on CAD of Integrated Circuits and Systems, 38(12):2343-2356, 2019. [doi]

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