Dhiraj K. Pradhan, Dimitri Kagaris, Rohit Gambhir. A Hamming Distance Based Test Pattern Generator with Improved Fault Coverage. In 11th IEEE International On-Line Testing Symposium (IOLTS 2005), 6-8 July 2005, Saint Raphael, France. pages 221-226, IEEE Computer Society, 2005. [doi]
Abstract is missing.