Ira Pramanick, Ankan K. Pramanick. Parallel Delay Fault Coverage and Test Quality Evaluation. In Proceedings IEEE International Test Conference 1995, Driving Down the Cost of Test, Washington, DC, USA, October 21-25, 1995. pages 113-122, IEEE Computer Society, 1995.
@inproceedings{PramanickP95,
title = {Parallel Delay Fault Coverage and Test Quality Evaluation},
author = {Ira Pramanick and Ankan K. Pramanick},
year = {1995},
tags = {test coverage, testing, coverage},
researchr = {https://researchr.org/publication/PramanickP95},
cites = {0},
citedby = {0},
pages = {113-122},
booktitle = {Proceedings IEEE International Test Conference 1995, Driving Down the Cost of Test, Washington, DC, USA, October 21-25, 1995},
publisher = {IEEE Computer Society},
isbn = {0-7803-2992-9},
}