Chip Level Power Supply Partitioning for IDDQ Testing Using Built-In Current Sensors - researchr publication authors

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Abhijit Prasad, D. M. H. Walker. Chip Level Power Supply Partitioning for IDDQ Testing Using Built-In Current Sensors. In 18th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2003), 3-5 November 2003, Boston, MA, USA, Proceedings. pages 140, IEEE Computer Society, 2003. [doi]

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