Abhijit Prasad, D. M. H. Walker. Chip Level Power Supply Partitioning for IDDQ Testing Using Built-In Current Sensors. In 18th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2003), 3-5 November 2003, Boston, MA, USA, Proceedings. pages 140, IEEE Computer Society, 2003. [doi]
@inproceedings{PrasadW03,
title = {Chip Level Power Supply Partitioning for IDDQ Testing Using Built-In Current Sensors},
author = {Abhijit Prasad and D. M. H. Walker},
year = {2003},
url = {http://csdl.computer.org/comp/proceedings/dft/2003/2042/00/20420140abs.htm},
tags = {testing, partitioning},
researchr = {https://researchr.org/publication/PrasadW03},
cites = {0},
citedby = {0},
pages = {140},
booktitle = {18th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2003), 3-5 November 2003, Boston, MA, USA, Proceedings},
publisher = {IEEE Computer Society},
isbn = {0-7695-2042-1},
}