Demystifying automotive safety and security for semiconductor developer

V. Prasanth, David Foley, Srivaths Ravi. Demystifying automotive safety and security for semiconductor developer. In IEEE International Test Conference, ITC 2017, Fort Worth, TX, USA, October 31 - Nov. 2, 2017. pages 1-10, IEEE, 2017. [doi]

Authors

V. Prasanth

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David Foley

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Srivaths Ravi

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