V. Prasanth, David Foley, Srivaths Ravi. Demystifying automotive safety and security for semiconductor developer. In IEEE International Test Conference, ITC 2017, Fort Worth, TX, USA, October 31 - Nov. 2, 2017. pages 1-10, IEEE, 2017. [doi]
@inproceedings{PrasanthFR17, title = {Demystifying automotive safety and security for semiconductor developer}, author = {V. Prasanth and David Foley and Srivaths Ravi}, year = {2017}, doi = {10.1109/TEST.2017.8242074}, url = {https://doi.org/10.1109/TEST.2017.8242074}, researchr = {https://researchr.org/publication/PrasanthFR17}, cites = {0}, citedby = {0}, pages = {1-10}, booktitle = {IEEE International Test Conference, ITC 2017, Fort Worth, TX, USA, October 31 - Nov. 2, 2017}, publisher = {IEEE}, isbn = {978-1-5386-3413-4}, }