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An Open Modular Test Concept for the DSP KISS-16Vs

J. Preißner, G.-H. Huaman-Bollo, G. Mahlich, Johannes Schuck, Hans Sahm, P. Weingart, D. Weinsziehr, J. Yeandel, R. Evans. An Open Modular Test Concept for the DSP KISS-16Vs. In Proceedings IEEE International Test Conference 1992, Discover the New World of Test and Design, Baltimore, Maryland, USA, September 20-24, 1992. pages 678-683, IEEE Computer Society, 1992.

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