Enhancement of simulation-based semiconductor manufacturing forecast quality through hybrid tool down time modeling

Patrick Preuss, André Naumann, Wolfgang Scholl, Boon-Ping Gan, Peter Lendermann. Enhancement of simulation-based semiconductor manufacturing forecast quality through hybrid tool down time modeling. In Stephen J. Buckley, John A. Miller, editors, Proceedings of the 2014 Winter Simulation Conference, Savannah, GA, USA, December 7-10, 2014. pages 2444-2453, IEEE/ACM, 2014. [doi]

Authors

Patrick Preuss

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André Naumann

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Wolfgang Scholl

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Boon-Ping Gan

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Peter Lendermann

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