Enhancement of simulation-based semiconductor manufacturing forecast quality through hybrid tool down time modeling

Patrick Preuss, André Naumann, Wolfgang Scholl, Boon-Ping Gan, Peter Lendermann. Enhancement of simulation-based semiconductor manufacturing forecast quality through hybrid tool down time modeling. In Stephen J. Buckley, John A. Miller, editors, Proceedings of the 2014 Winter Simulation Conference, Savannah, GA, USA, December 7-10, 2014. pages 2444-2453, IEEE/ACM, 2014. [doi]

@inproceedings{PreussNSGL14,
  title = {Enhancement of simulation-based semiconductor manufacturing forecast quality through hybrid tool down time modeling},
  author = {Patrick Preuss and André Naumann and Wolfgang Scholl and Boon-Ping Gan and Peter Lendermann},
  year = {2014},
  url = {http://dl.acm.org/citation.cfm?id=2694156},
  researchr = {https://researchr.org/publication/PreussNSGL14},
  cites = {0},
  citedby = {0},
  pages = {2444-2453},
  booktitle = {Proceedings of the 2014 Winter Simulation Conference, Savannah, GA, USA, December 7-10, 2014},
  editor = {Stephen J. Buckley and John A. Miller},
  publisher = {IEEE/ACM},
}