Michael Pronath, Volker Gloeckel, Helmut E. Graeb. A Parametric Test Method for Analog Components in Integrated Mixed-Signal Circuits. In Ellen Sentovich, editor, Proceedings of the 2000 IEEE/ACM International Conference on Computer-Aided Design, 2000, San Jose, California, USA, November 5-9, 2000. pages 557-561, IEEE, 2000.
@inproceedings{PronathGG00,
title = {A Parametric Test Method for Analog Components in Integrated Mixed-Signal Circuits},
author = {Michael Pronath and Volker Gloeckel and Helmut E. Graeb},
year = {2000},
tags = {testing, e-science},
researchr = {https://researchr.org/publication/PronathGG00},
cites = {0},
citedby = {0},
pages = {557-561},
booktitle = {Proceedings of the 2000 IEEE/ACM International Conference on Computer-Aided Design, 2000, San Jose, California, USA, November 5-9, 2000},
editor = {Ellen Sentovich},
publisher = {IEEE},
isbn = {0-7803-6448-1},
}