Michael Pronath, Volker Gloeckel, Helmut E. Graeb. A Parametric Test Method for Analog Components in Integrated Mixed-Signal Circuits. In Ellen Sentovich, editor, Proceedings of the 2000 IEEE/ACM International Conference on Computer-Aided Design, 2000, San Jose, California, USA, November 5-9, 2000. pages 557-561, IEEE, 2000.
Abstract is missing.