Mihalis Psarakis, Antonis M. Paschalis, Nektarios Kranitis, Dimitris Gizopoulos, Yervant Zorian. Robust and Low-Cost BIST Architectures for Sequential Fault Testing in Datapath Multipliers. In 19th IEEE VLSI Test Symposium (VTS 2001), Test and Diagnosis in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA, USA. pages 15-21, IEEE Computer Society, 2001. [doi]
@inproceedings{PsarakisPKGZ01,
title = {Robust and Low-Cost BIST Architectures for Sequential Fault Testing in Datapath Multipliers},
author = {Mihalis Psarakis and Antonis M. Paschalis and Nektarios Kranitis and Dimitris Gizopoulos and Yervant Zorian},
year = {2001},
url = {http://csdl.computer.org/comp/proceedings/vts/2001/1122/00/11220015abs.htm},
tags = {architecture, testing},
researchr = {https://researchr.org/publication/PsarakisPKGZ01},
cites = {0},
citedby = {0},
pages = {15-21},
booktitle = {19th IEEE VLSI Test Symposium (VTS 2001), Test and Diagnosis in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA, USA},
publisher = {IEEE Computer Society},
isbn = {0-7695-1122-8},
}