Mihalis Psarakis, Antonis M. Paschalis, Nektarios Kranitis, Dimitris Gizopoulos, Yervant Zorian. Robust and Low-Cost BIST Architectures for Sequential Fault Testing in Datapath Multipliers. In 19th IEEE VLSI Test Symposium (VTS 2001), Test and Diagnosis in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA, USA. pages 15-21, IEEE Computer Society, 2001. [doi]
Abstract is missing.