Post-Silicon Clock Deskew Employing Hot-Carrier Injection Trimming With On-Chip Skew Monitoring and Auto-Stressing Scheme for Sub/Near Threshold Digital Circuits - researchr publication authors

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Yu Pu, Xin Zhang, Katsuyuki Ikeuchi, Atsushi Muramatsu, Atsushi Kawasumi, Makoto Takamiya, Masahiro Nomura, Hirofumi Shinohara, Takayasu Sakurai. Post-Silicon Clock Deskew Employing Hot-Carrier Injection Trimming With On-Chip Skew Monitoring and Auto-Stressing Scheme for Sub/Near Threshold Digital Circuits. IEEE Trans. on Circuits and Systems, 58-II(5):294-298, 2011. [doi]

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