Yu Pu, Xin Zhang, Katsuyuki Ikeuchi, Atsushi Muramatsu, Atsushi Kawasumi, Makoto Takamiya, Masahiro Nomura, Hirofumi Shinohara, Takayasu Sakurai. Post-Silicon Clock Deskew Employing Hot-Carrier Injection Trimming With On-Chip Skew Monitoring and Auto-Stressing Scheme for Sub/Near Threshold Digital Circuits. IEEE Trans. on Circuits and Systems, 58-II(5):294-298, 2011. [doi]
@article{PuZIMKTNSS11,
title = {Post-Silicon Clock Deskew Employing Hot-Carrier Injection Trimming With On-Chip Skew Monitoring and Auto-Stressing Scheme for Sub/Near Threshold Digital Circuits},
author = {Yu Pu and Xin Zhang and Katsuyuki Ikeuchi and Atsushi Muramatsu and Atsushi Kawasumi and Makoto Takamiya and Masahiro Nomura and Hirofumi Shinohara and Takayasu Sakurai},
year = {2011},
doi = {10.1109/TCSII.2011.2149050},
url = {http://dx.doi.org/10.1109/TCSII.2011.2149050},
researchr = {https://researchr.org/publication/PuZIMKTNSS11},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on Circuits and Systems},
volume = {58-II},
number = {5},
pages = {294-298},
}