Francesco M. Puglisi, Paolo Pavan, Andrea Padovani, Luca Larcher, Gennadi Bersuker. Random Telegraph Signal noise properties of HfOx RRAM in high resistive state. In Proceedings of the 2012 European Solid-State Device Research Conference, ESSDERC 2012, Bordeaux, France, September 17-21, 2012. pages 274-277, IEEE, 2012. [doi]
Abstract is missing.