CHEF: CHaracterizing Elusive Logic Circuit Failures

Ruben Purdy, Chris Nigh, Wei Li, R. D. Shawn Blanton. CHEF: CHaracterizing Elusive Logic Circuit Failures. In 43rd IEEE VLSI Test Symposium, VTS 2025, Tempe, AZ, USA, April 28-30, 2025. pages 1-7, IEEE, 2025. [doi]

Abstract

Abstract is missing.