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Ruben Purdy, Chris Nigh, Wei Li, R. D. Shawn Blanton. CHEF: CHaracterizing Elusive Logic Circuit Failures. In 43rd IEEE VLSI Test Symposium, VTS 2025, Tempe, AZ, USA, April 28-30, 2025. pages 1-7, IEEE, 2025. [doi]
Abstract is missing.