SI-SMART: Functional test generation for RTL circuits using loop abstraction and learning recurrence relationships - researchr publication authors

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Prateek Puri, Michael S. Hsiao. SI-SMART: Functional test generation for RTL circuits using loop abstraction and learning recurrence relationships. In 33rd IEEE International Conference on Computer Design, ICCD 2015, New York City, NY, USA, October 18-21, 2015. pages 38-45, IEEE Computer Society, 2015. [doi]

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