V. Putcha, Erik Bury, Jacopo Franco, A. Walke, S. E. Zhao, U. Peralagu, M. Zhao, A. Alian, Ben Kaczer, Niamh Waldron, Dimitri Linten, Bertrand Parvais, Nadine Collaert. Exploring the DC reliability metrics for scaled GaN-on-Si devices targeted for RF/5G applications. In 2020 IEEE International Reliability Physics Symposium, IRPS 2020, Dallas, TX, USA, April 28 - May 30, 2020. pages 1-8, IEEE, 2020. [doi]
Abstract is missing.