Carol Pyron, Rekha Bangalore, Dawit Belete, Jason Goertz, Ashutosh Razdan, Denise Younger. Silicon Symptoms to Solutions: Applying Design for Debug Techniques. In Proceedings IEEE International Test Conference 2002, Baltimore, MD, USA, October 7-10, 2002. pages 664-672, IEEE Computer Society, 2002. [doi]
Abstract is missing.