Xiaoning Qi, Sam C. Lo, Yansheng Luo, Alex Gyure, Mahmoud Shahram, Kishore Singhal. Simulation and analysis of inductive impact on VLSI interconnects in the presence of process variations. In Proceedings of the IEEE 2005 Custom Integrated Circuits Conference, CICC 2005, DoubleTree Hotel, San Jose, California, USA, September 18-21, 2005. pages 309-312, IEEE, 2005. [doi]
Abstract is missing.