Qi-De Qian, Sheldon X.-D. Tan. Advanced Physical Models for Mask Data Verification and Impacts on Physical Layout Synthesis. In 4th International Symposium on Quality of Electronic Design (ISQED 2003), 24-26 March 2003, San Jose, CA, USA. pages 125-130, IEEE Computer Society, 2003. [doi]
@inproceedings{QianT03,
title = {Advanced Physical Models for Mask Data Verification and Impacts on Physical Layout Synthesis},
author = {Qi-De Qian and Sheldon X.-D. Tan},
year = {2003},
url = {http://csdl.computer.org/comp/proceedings/isqed/2003/1881/00/18810125abs.htm},
tags = {layout},
researchr = {https://researchr.org/publication/QianT03},
cites = {0},
citedby = {0},
pages = {125-130},
booktitle = {4th International Symposium on Quality of Electronic Design (ISQED 2003), 24-26 March 2003, San Jose, CA, USA},
publisher = {IEEE Computer Society},
isbn = {0-7695-1881-8},
}