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Analytical Low Frequency NBTI Compact Modeling with H2 Locking and Electron Fast Capture and Emission

J. Qing, Y. Zeng, X. J. Li, P. J. Zhang, Y. B. Sun, Y. L. Shi. Analytical Low Frequency NBTI Compact Modeling with H2 Locking and Electron Fast Capture and Emission. J. Electronic Testing, 34(5):599-605, 2018. [doi]

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J. Qing

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Y. Zeng

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X. J. Li

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P. J. Zhang

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Y. B. Sun

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Y. L. Shi

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