J. Qing, Y. Zeng, X. J. Li, P. J. Zhang, Y. B. Sun, Y. L. Shi. Analytical Low Frequency NBTI Compact Modeling with H2 Locking and Electron Fast Capture and Emission. J. Electronic Testing, 34(5):599-605, 2018. [doi]
@article{QingZLZSS18,
title = {Analytical Low Frequency NBTI Compact Modeling with H2 Locking and Electron Fast Capture and Emission},
author = {J. Qing and Y. Zeng and X. J. Li and P. J. Zhang and Y. B. Sun and Y. L. Shi},
year = {2018},
doi = {10.1007/s10836-018-5751-8},
url = {https://doi.org/10.1007/s10836-018-5751-8},
researchr = {https://researchr.org/publication/QingZLZSS18},
cites = {0},
citedby = {0},
journal = {J. Electronic Testing},
volume = {34},
number = {5},
pages = {599-605},
}