A Statistical Fault Coverage Metric for Realistic Path Delay Faults - researchr publication authors

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Wangqi Qiu, Xiang Lu, Jing Wang, Zhuo Li, D. M. H. Walker, Weiping Shi. A Statistical Fault Coverage Metric for Realistic Path Delay Faults. In 22nd IEEE VLSI Test Symposium (VTS 2004), 25-29 April 2004, Napa Valley, CA, USA. pages 37-42, IEEE Computer Society, 2004. [doi]

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