Wangqi Qiu, Xiang Lu, Jing Wang, Zhuo Li, D. M. H. Walker, Weiping Shi. A Statistical Fault Coverage Metric for Realistic Path Delay Faults. In 22nd IEEE VLSI Test Symposium (VTS 2004), 25-29 April 2004, Napa Valley, CA, USA. pages 37-42, IEEE Computer Society, 2004. [doi]
@inproceedings{QiuLWLWS04,
title = {A Statistical Fault Coverage Metric for Realistic Path Delay Faults},
author = {Wangqi Qiu and Xiang Lu and Jing Wang and Zhuo Li and D. M. H. Walker and Weiping Shi},
year = {2004},
url = {http://csdl.computer.org/comp/proceedings/vts/2004/2134/00/21340037abs.htm},
tags = {coverage},
researchr = {https://researchr.org/publication/QiuLWLWS04},
cites = {0},
citedby = {0},
pages = {37-42},
booktitle = {22nd IEEE VLSI Test Symposium (VTS 2004), 25-29 April 2004, Napa Valley, CA, USA},
publisher = {IEEE Computer Society},
isbn = {0-7695-2134-7},
}