Wangqi Qiu, D. M. H. Walker, Neil Simpson, Divya Reddy, Anthony Moore. Comparison of Delay Tests on Silicon. In Scott Davidson, Anne Gattiker, editors, 2006 IEEE International Test Conference, ITC 2006, Santa Clara, CA, USA, October 22-27, 2006. pages 1-10, IEEE, 2006. [doi]
Abstract is missing.