Wangqi Qiu, Jing Wang, D. M. H. Walker, Divya Reddy, Zhuo Li, Weiping Shi, Hari Balachandran. K Longest Paths Per Gate (KLPG) Test Generation for Scan-Based Sequential Circuits. In Proceedings 2004 International Test Conference (ITC 2004), October 26-28, 2004, Charlotte, NC, USA. pages 223-231, IEEE, 2004. [doi]
Abstract is missing.