Li Qu, Xiaole Cui, Xiaoxin Cui. A Testability Enhancement Method for the Memristor Ratioed Logic Circuits. In 29th IEEE Asian Test Symposium, ATS 2020, Penang, Malaysia, November 23-26, 2020. pages 1-6, IEEE, 2020. [doi]
@inproceedings{QuCC20, title = {A Testability Enhancement Method for the Memristor Ratioed Logic Circuits}, author = {Li Qu and Xiaole Cui and Xiaoxin Cui}, year = {2020}, doi = {10.1109/ATS49688.2020.9301537}, url = {https://doi.org/10.1109/ATS49688.2020.9301537}, researchr = {https://researchr.org/publication/QuCC20}, cites = {0}, citedby = {0}, pages = {1-6}, booktitle = {29th IEEE Asian Test Symposium, ATS 2020, Penang, Malaysia, November 23-26, 2020}, publisher = {IEEE}, isbn = {978-1-7281-7467-9}, }