Low Temperature Characterization and Modeling of Hot Carrier Injection in 14 nm Si FinFET

Junru Qu, Dong Liu, Bing Chen, Ying Sun, Xinze Li, Chengji Jin, Jiajia Chen, Haoji Qian, Rongzong Shen, Xiao Yu, Dawei Gao, Ran Cheng, Genquan Han. Low Temperature Characterization and Modeling of Hot Carrier Injection in 14 nm Si FinFET. In IEEE International Reliability Physics Symposium, IRPS 2024, Grapevine, TX, USA, April 14-18, 2024. pages 70, IEEE, 2024. [doi]

Abstract

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