A CMOS fuse for safe release of CMOS-MEMS devices

Peng Qu, Hongwei Qu. A CMOS fuse for safe release of CMOS-MEMS devices. In 2017 IEEE SENSORS, Glasgow, United Kingdom, October 29 - November 1, 2017. pages 1-3, IEEE, 2017. [doi]

Abstract

Abstract is missing.